zeng xiongwen, lu qisheng, zhao yijun, et al. THE PHOTOELECTRIC CHARACTERISTIC RESEARCH OF CCDJ. High Power Laser and Partical Beams, 1999, 11(01).
Citation: zeng xiongwen, lu qisheng, zhao yijun, et al. THE PHOTOELECTRIC CHARACTERISTIC RESEARCH OF CCDJ. High Power Laser and Partical Beams, 1999, 11(01).

THE PHOTOELECTRIC CHARACTERISTIC RESEARCH OF CCD

  • According to the basic element of MOS device, the analytic expressions of function relation between output and input of CCD are derived, and its various photoelectric characteristics (sensitivity, crosstalk threshold power, etc.)are obtained, the temperature effect is studied qualitatively and the countermeasure against laser jamming is discussed .
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