NUMERICAL SIMULATION OF DISORDER SOFT XRAY MULTILAYER FOR A MAXIMUM INTEGRATED REFLECTIVITY

ke changjun; zhang tieqiang; wang zhanshan; cao jianlin; chen xingdan

Volume 11 Issue 01

Jan. 1999

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ke changjun, zhang tieqiang, wang zhanshan, et al. NUMERICAL SIMULATION OF DISORDER SOFT XRAY MULTILAYER FOR A MAXIMUM INTEGRATED REFLECTIVITY[J]. High Power Laser and Particle Beams, 1999, 11.

Citation:

ke changjun, zhang tieqiang, wang zhanshan, et al. NUMERICAL SIMULATION OF DISORDER SOFT XRAY MULTILAYER FOR A MAXIMUM INTEGRATED REFLECTIVITY[J]. High Power Laser and Particle Beams, 1999, 11.

ke changjun, zhang tieqiang, wang zhanshan, et al. NUMERICAL SIMULATION OF DISORDER SOFT XRAY MULTILAYER FOR A MAXIMUM INTEGRATED REFLECTIVITY[J]. High Power Laser and Particle Beams, 1999, 11.

Citation:

ke changjun, zhang tieqiang, wang zhanshan, et al. NUMERICAL SIMULATION OF DISORDER SOFT XRAY MULTILAYER FOR A MAXIMUM INTEGRATED REFLECTIVITY[J]. High Power Laser and Particle Beams, 1999, 11.

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NUMERICAL SIMULATION OF DISORDER SOFT XRAY MULTILAYER FOR A MAXIMUM INTEGRATED REFLECTIVITY

1.
Department of Applied Physics,Jilin University of Technology,Changchun 130025;
2.
The State Key Laboratory of Applied Optics,Changchun Institute of Optics and Fine Mechanics, Chinese Academy of Science ,Changchun 130022

Publish Date: 1999-01-15

Abstract

Abstract

A random method used for improving light throughput of a soft Xray multilayer mirror has been developed. It is demon strated that layer thickness disorder yields band broadening and increased integrated reflectivity,and achieved 75% increase in integrated reflctivity in the 12.4～20.1nm spectral range with respect to periodic multilayer with its first Bragg peak in the center of that range．
- disordered multilayer,
- soft x ray,
- random number,
- integratedreflectivity