Volume 12 Issue 02
Apr.  2000
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Article Navigation >  High Power Laser and Particle Beams  > 2000  >  12(02): 0-

  • Publish Date: 2000-04-15
    Abstract
  • By means of the program mPND1D (one-dimensional modeling for PN junction devices), the diode failure and burnout energy absorbed have been calculated for different EMP pulsed voltage sources, and the results are analyzed preliminarily.
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    通讯作者: 陈斌, bchen63@163.com
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      沈阳化工大学材料科学与工程学院 沈阳 110142

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