Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGEJ. High Power Laser and Partical Beams, 1992, 04(03): 473-476.
Citation:
Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGEJ. High Power Laser and Partical Beams, 1992, 04(03): 473-476.
Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGEJ. High Power Laser and Partical Beams, 1992, 04(03): 473-476.
Citation:
Zhang Qiren, Yang Shangjin, He An, et al. IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGEJ. High Power Laser and Partical Beams, 1992, 04(03): 473-476.
IN SITU CALIBRATION OF KODAK SWR FILM IN EUV RANGE
A method of a relative calibration of SWR film used for mearuring intensity of X rays from laser produced plasma was reported in this paper. Using X rays from the plasma as a source of calibration, we have measured characteristics of Kodak SWR film produced by U.S.A. The result was used to modify the gain coefficiet of X-ray laser measured in our laboratory.
DownLoad: