wang wei, ni yuan-long, wan bing-gen, et al. Single-shot measurement of soft X-ray Mo/Si multi-layer mirror reflectance[J]. High Power Laser and Particle Beams, 2001, 13.
Citation:
wang wei, ni yuan-long, wan bing-gen, et al. Single-shot measurement of soft X-ray Mo/Si multi-layer mirror reflectance[J]. High Power Laser and Particle Beams, 2001, 13.
wang wei, ni yuan-long, wan bing-gen, et al. Single-shot measurement of soft X-ray Mo/Si multi-layer mirror reflectance[J]. High Power Laser and Particle Beams, 2001, 13.
Citation:
wang wei, ni yuan-long, wan bing-gen, et al. Single-shot measurement of soft X-ray Mo/Si multi-layer mirror reflectance[J]. High Power Laser and Particle Beams, 2001, 13.
A new method of single-shot measurement of normal incidence soft x-ray Mo/Si multilayer mirror’s reflectance is proposed, experiment has been performed using laser-produced plasma x-ray source, flat field grating spectrometer, soft x-ray CCD. Grazing incident mirror was employed to eliminate high-order contribution. Reflectance of Mo/Si multi-layer mirror with a 13.9 nm designed center wavelength is measured in one laser shot.
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