Scattering comparison between FXRMC and MCNP in flash X-ray radiography

Scattering is a most important factor in determining the object information in high energy X-ray radiography. The characteristics and tally methods of FXRMC and MCNP are given. Several high energy X-ray radiography systems are simulated with FXRMC and MCNP using the same X-ray source parameters. It is shown that the relative difference of the scatterings simulated by FXRMC and MCNP is within 5%. The FXRMC and MCNP scattering exposure distributions agree well with the experimental result for the aluminum cone radiography. Therefore, both FXRMC and MCNP can be used to simulate the scattering of high energy X-ray radiography. Suggests are also given to verify the results of Monte Carlo simulation.