chen si-fu, ding bo-nan, xia lian-sheng, et al. Time-resolved beam profile measurement of high-current , shortpulse electron-beam[J]. High Power Laser and Particle Beams, 2002, 14.
Citation:
chen si-fu, ding bo-nan, xia lian-sheng, et al. Time-resolved beam profile measurement of high-current , shortpulse electron-beam[J]. High Power Laser and Particle Beams, 2002, 14.
chen si-fu, ding bo-nan, xia lian-sheng, et al. Time-resolved beam profile measurement of high-current , shortpulse electron-beam[J]. High Power Laser and Particle Beams, 2002, 14.
Citation:
chen si-fu, ding bo-nan, xia lian-sheng, et al. Time-resolved beam profile measurement of high-current , shortpulse electron-beam[J]. High Power Laser and Particle Beams, 2002, 14.
A beam profile diagnostic system of high current, short pulse electron based on Cerenkov radiation is introduced. Cerenkov radiation signals produced by thin quartz foil placed in the beam path are detected with streak camera. Experiments confirming Cerenkov radiation and time-resolved beam profile measurement are realized with this system on the 2MeV injector of CAEP. The resolution of the system is estimated to be about 0.74 mm and 1.75ns.
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