Influence of characteristic X-ray of impurity element on anonymous spectral lines excited by hydrogen gas discharge source bombarding targets

A series of low energy X-ray spectral lines which have constant energy have been detected in hydrogen gas discharge source bombarding targets. Their energy are 1.7 keV, 2.3 keV, 2.6 keV, 3.3 keV and 3.7 keV, respectively. These anonymous spectral lines can not be explained by the known theories.There are still possibilities that they are produced by potential impurity elements in targets or in the discharge chamber, although the energy of the anonymous spectral lines are close to the energy of the characteristic X-ray of some elements, such as Si, Ta, S, Cl, K, Ca and Ti, etc. In this paper, the origin of impurity elements in the experimental system are analyzed, the influence of impurity elements in the discharge chamber and targets on the new spectral lines are studied, and the target s