Development of Shanghai Synchrotron Radiation Facility synchrotron radiation interferometer

Synchrotron radiation interferometers, based on Van Citterut-Zernike theorem, are developed to measure the electron transverse beam size and emittance in the Shanghai Synchrotron Radiation Facility (SSRF) storage ring. The major engineering considerations including the optical layout, key devices, signal processing method and software architecture of data acquisition are analyzed. The system commissioning and optimization of operation parameters have been done with beam experiments. The beam experimental results show that measurement accuracy depends significantly on CCD gain and exposure time setting. Random measurement uncertainty is minimized to micron level with CCD setting of 0 dB gain and 200 ms exposure time. The electron transverse beam size of SSRF storage ring is measured precise