Test device for negative refractive index materials

To investigate the novel characteristics of negative refractive index materials(NRIMs), a test device was designed and fabricated based on the Snell law to measure the refractive characteristics of an X-band (8.2~12.4 GHz) NRIM sample consisting of ferrimagnetic materials and wire array. The refractive characteristics of the wedge-shaped paraffin sample and NRIM sample were tested with the device, respectively. The measurements of the paraffin sample demonstrate the validity of the fabricated device. The measurements of the NRIM sample exhibit the material’s negative refraction characteristic, which is then proven by the wave beam shift characteristic of the parallel-plate NRIM with electromagnetic simulations.