sun hong-bing, pei yuan-ji, xie ai-gen, et al. Multiplication effect of the secondary emission microwave electron gun[J]. High Power Laser and Particle Beams, 2004, 16.
Citation:
sun hong-bing, pei yuan-ji, xie ai-gen, et al. Multiplication effect of the secondary emission microwave electron gun[J]. High Power Laser and Particle Beams, 2004, 16.
sun hong-bing, pei yuan-ji, xie ai-gen, et al. Multiplication effect of the secondary emission microwave electron gun[J]. High Power Laser and Particle Beams, 2004, 16.
Citation:
sun hong-bing, pei yuan-ji, xie ai-gen, et al. Multiplication effect of the secondary emission microwave electron gun[J]. High Power Laser and Particle Beams, 2004, 16.
Using the primary program 3DRun given by code VC++, multiplication effect of secondary emission microwave electron gun(SEMEG) is investigated. The relation between multiplication effect and length of cavity and electric field in the gun is studied with onedimension simulation. The Longitudinal bunching and energy focusing of out electrons is calculated in detail at 10mm length of cavity and 5.4MV/m electric field in the gun. The beam dynamics with space charge effect is also investigated with 3DRun. The emittance of out beam is calculated. With simulation and analysis, it is proved that SEMEG can provide high-current, low-emittance electron pulse.