SENSITIVITY CURVE CALIBRATION OF KODAK SWR X-RAY FILM
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Abstract
On a Henke X-ray source we produced Kα line of C (277eV) and L line of Mo, and Kα line of Al (l.5keV) and Kα line of Ti (4.5keV) by X-ray excition. The X-ray intensities were monitored by proportional counters, we obtained sensitivity curves of Kodak SWR X-ray film for these different energy X rays.
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