Feⁿ⁺ beam profile diagnostics based on Al₂O₃：Cr scintillating screen

Some techniques of beam profile measurements such as wire rotating scan, Faraday cups array and infrared imagingwere investigated. A measurement device was built based on scintillating screen to cater for the demand of accelerator beam profile diagnostics. The device was bombarded under several tens to hundred nanoampere Fen+(n~512) ion beam. The Fen+ ion beam experiment shows that the imaging saturation is mainly caused by light intensity rather than scintillating screen. A way to solve the saturation problem with a specially developed lens was mentioned. The grayscale of beam profile imaging is approximately linear with respect to the beam intensity, and the reason for formation of this relationship was analyzed.