Study on electromagnetic sensitivity of power modules of high-speed comparator and clock driver

Li Ning; Peng Zhigang; He Chaohui

doi:10.11884/HPLPB202436.230385

Volume 36 Issue 9

Aug. 2024

Turn off MathJax

Article Contents

Article Navigation > High Power Laser and Particle Beams > 2024 > 36(9): 096003

Li Ning, Peng Zhigang, He Chaohui. Study on electromagnetic sensitivity of power modules of high-speed comparator and clock driver[J]. High Power Laser and Particle Beams, 2024, 36: 096003. doi: 10.11884/HPLPB202436.230385

Citation:

Li Ning, Peng Zhigang, He Chaohui. Study on electromagnetic sensitivity of power modules of high-speed comparator and clock driver[J]. High Power Laser and Particle Beams, 2024, 36: 096003. doi: 10.11884/HPLPB202436.230385

Citation:

PDF( 3541 KB)

Study on electromagnetic sensitivity of power modules of high-speed comparator and clock driver

doi: 10.11884/HPLPB202436.230385

Li Ning^{1, 2
,},
Peng Zhigang¹,
He Chaohui^{1
,
,}

1.
School of Energy and Power Engineering, Xi’an Jiaotong University, Xi’an 710049, China
2.
State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Xi’an 710024, China

Received Date: 2024-01-28
Accepted Date: 2024-06-28
Rev Recd Date: 2024-06-28

Available Online: 2024-06-27

Publish Date: 2024-08-16

Abstract

Abstract

High altitude electromagnetic pulse (HEMP) can produce electromagnetic pulse effects on electronic devices or systems that cannot be ignored. In this paper, a high-speed comparator and a clock driver are selected, and the electromagnetic sensitivity of the power modules of these two devices is studied by the experimental method of pulse current injection (PCI). The test results show that the rising edge of the double exponential pulse current is the main cause of the output glitch of the high-speed comparator and clock driver, and the amplitude of the disturbance is affected by the amplitude of the injected pulse current. The electromagnetic sensitivity of the power module of the high-speed comparator is different at different output level. Different operating frequencies of high-speed comparators and clock drivers will show different electromagnetic sensitivity. The results have certain guiding significance for electromagnetic sensitivity analysis and hardening of electronic devices or systems.
- high-speed comparator,
- clock driver,
- high-altitude electromagnetic pulse,
- electromagnetic sensitivity,
- pulse current injection

FullText(HTML)

References(22)

References

[1]	毛从光, 程引会, 谢彦召. 高空电磁脉冲技术基础[M]. 北京: 科学出版社, 2019 Mao Congguang, Cheng Yinhui, Xie Yanzhao. Fundamentals of high-altitude electromagnetic pulse technology[M]. Beijing: Science Press, 2019
[2]	秦锋, 钟少武, 崔志同, 等. 核安保典型系统电磁脉冲效应试验研究[J]. 强激光与粒子束, 2019, 31:113201 doi: 10.11884/HPLPB201931.190219 Qin Feng, Zhong Shaowu, Cui Zhitong, et al. Experiment research on electromagnetic pulse effects of typical nuclear security system[J]. High Power Laser and Particle Beams, 2019, 31: 113201 doi: 10.11884/HPLPB201931.190219
[3]	Camp M, Garbe H, Nitsch D. UWB and EMP susceptibility of modern electronics[C]//2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility. 2001: 1015-1020.
[4]	崔志同, 毛从光, 孙蓓云, 等. LDO稳压器电磁脉冲损伤阈值试验研究[J]. 微电子学, 2013, 43(3):423-425 Cui Zhitong, Mao Congguang, Sun Beiyun, et al. Damage threshold characterization of LDO regulator for EMP interference[J]. Microelectronics, 2013, 43(3): 423-425
[5]	郑箘, 王璐静, 任凯琦. 强电磁脉冲对计算机电缆的注入毁伤效应研究[J]. 无线电工程, 2016, 46(8):79-82 Zheng Jun, Wang Lujing, Ren Kaiqi. Study on damage effect of high electromagnetic pulse injecting computer cable interfaces[J]. Radio Engineering, 2016, 46(8): 79-82
[6]	李君. 系统级封装的电源完整性分析和电磁干扰研究[D]. 成都: 西南交通大学, 2010: 10-27 Li Jun. The power integrity analysis and electromagnetic interference study in system-in-package[D]. Chengdu: Southwest Jiaotong University, 2010: 10-27
[7]	Mejecaze G, Dubois T, Curos L, et al. Failure scenario of power supply due to conducted electric pulse from E1 HEMP[J]. IEEE Transactions on Electromagnetic Compatibility, 2023, 65(2): 464-474. doi: 10.1109/TEMC.2022.3227335
[8]	王书平, 刘尚合, 侯民胜. 核电磁脉冲对单片机系统的辐照效应研究[J]. 军械工程学院学报, 2002, 14(1):11-15 Wang Shuping, Liu Shanghe, Hou Minsheng. Study on irradiation effects of nuclear electromagnetic pulse to single chip computer system[J]. Journal of Ordnance Engineering College, 2002, 14(1): 11-15
[9]	韩军, 谢彦召, 翟爱斌, 等. 静态随机存储器的电磁脉冲效应实验研究[J]. 核电子学与探测技术, 2010, 30(11):1423-1426 Han Jun, Xie Yanzhao, Zhai Aibin, et al. Experimental investigation on EMP effect of SRAM[J]. Nuclear Electronics & Detection Technology, 2010, 30(11): 1423-1426
[10]	郭艳辉, 李子森, 杨宝山, 等. 国外计算机强电磁脉冲敏感度实验结果的研究[J]. 安全与电磁兼容, 2014(3):67-70 Guo Yanhui, Li Zisen, Yang Baoshan, et al. Study of results on computer system HPEM susceptibility researched abroad[J]. Safety & EMC, 2014(3): 67-70
[11]	史建永. 高空核电磁脉冲电流注入方法研究[D]. 石家庄: 石家庄铁道大学, 2021: 1-7 Shi Jianyong. Research on high-altitude nuclear electromagnetic pulse current injection method[D]. Shijiazhuang: Shijiazhuang Tiedao University, 2021: 1-7
[12]	崔志同. HEMP脉冲电流注入的仿真与实验研究[D]. 西安: 西安电子科技大学, 2020: 1-10 Cui Zhitong. Simulation and experimental research on HEMP pulsed current injection[D]. Xian: Xidian University, 2020: 1-10
[13]	陈明, 程引会, 吴伟, 等. 80C196KC单片机电磁脉冲效应模拟实验研究[C]//第八届全国抗辐射电子学与电磁脉冲学术交流会论文集. 2005: 442-445 Chen Ming, Cheng Yinhui, Wu Wei, et al. Simulation experiment of electromagnetic pulse effect by 80C196KC microcontroller[C]//The 8th National Anti-radiation Electronics and Electromagnetic Pulse Academic Exchange Conference. 2005: 442-445
[14]	Kwak S, Nah W, Kim S. Electromagnetic susceptibility analysis of I/O buffers using the bulk current injection method[J]. JSTS: Journal of Semiconductor Technology and Science, 2013, 13(2): 114-126. doi: 10.5573/JSTS.2013.13.2.114
[15]	Li Chengjin, Liu Yuan, Liu Jianbo, et al. Electromagnetic interference effects in the bipolar voltage comparators[C]//2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS). 2014: 185-188.
[16]	夏德威, 杜传报, 曹菲, 等. 低噪声放大器电磁脉冲效应表征和阈值分布函数确定方法[J]. 现代应用物理, 2021, 12:040504 Xia Dewei, Du Chuanbao, Cao Fei, et al. Effects characterization of low noise amplifier and determination of threshold distribution function to high-altitude electromagnetic pulse[J]. Modern Applied Physics, 2021, 12: 040504
[17]	Du Chuanbao, Xia Dewei, Huang Quan, et al. Research on electromagnetic susceptibility of electronic modules in component-level HEMP PCI test[J]. Energies, 2022, 15: 1409. doi: 10.3390/en15041409
[18]	Guo Yaxin, Li Yang, Li Junlin, et al. Experimental study of transient dose rate effects of two level-shifting transceivers and simulations on their ESD circuits[J]. IEEE Transactions on Nuclear Science, 2022, 69(5): 1157-1166. doi: 10.1109/TNS.2022.3140555
[19]	Huang Kaiping, Peng Polin, Chu Liwei, et al. ESD protection diode with guard ring layout optimized for latch-up immunity enhancement in FinFET technology[C]//2019 41st Annual EOS/ESD Symposium (EOS/ESD). 2019: 1-4.
[20]	张翰宗. 系统级封装中电源完整性的分析与研究[D]. 西安: 西安电子科技大学, 2017: 5-12 Zhang Hanzong. Analysis and investigation of power integrity for system-in-package[D]. Xian: Xidian University, 2017: 5-12
[21]	房丽丽, 章传芳. ANSYS信号完整性和电源完整性分析与仿真实例[M]. 北京: 中国水利水电出版社, 2018 Fang Lili, Zhang Chuanfang. ANSYS signal integrity and power integrity analysis and simulation examples[M]. Beijing: China Water&Power Press, 2018
[22]	周润景, 王洪艳. 基于Cadence的信号和电源完整性设计与分析[M]. 北京: 电子工业出版社, 2017 Zhou Runjing, Wang Hongyan. Signal and power integrity design and analysis based on cadence[M]. Beijing: Publishing House of Electronics Industry, 2017