Experimental study on microwave vulnerability effect of integrated circuit

The microwave vulnerability effect of IC was presented in this paper. The damage power threshold of IC will decrease with the decrease of microwave frequency or the increase of pulse repetitive frequency, and if the microwave pulse width become larger, the damage power threshold will decrease too. However, there is an inflexion range and the damage power threshold varies little when the pulse width is larger than the inflexion range. The experiment results show that the damage power threshold of IC fit normal distribution, and the variance is very small, so the damage probability fits 0—1 distribution.