高能电子成像暗场成像技术特性研究及改进方案

Characteristics and improvement scheme of dark-field imaging of high energy electron radiography

  • 摘要: 基于EGS5与PARMELA模拟软件组成的高能电子成像系统,对暗场成像的模拟研究发现,通过调节光阑位置实现的暗场成像结果存在失真现象。针对该失真现象提出的改进方案,消除了暗场成像结果的失真。通过对40 MeV电子透射7~224 μm的铝样品开展的成像模拟结果表明:40 MeV高能电子暗场成像技术在铝样品厚度小于25 μm情况下具有明显的面密度分辨优势,且空间分辨率达到μm量级,非常适用于高能量密度物质诊断。

     

    Abstract: The simulations of dark-field imaging of high energy electron radiography show that the dark field imaging is distorted in the case of large angle selected. In order to eliminate distortion, an optimized scheme is proposed in this paper. The results of high Energy Electron Radiography (HEER) simulations by optimization show that the dark-field image has better areal density resolution when the thickness of aluminum target is less than 25 μm, and the spatial resolution of dark-field imaging is about several microns. In summary, dark-field imaging of high energy electron radiography is ideal to thin warm dense matter specimen diagnosis.

     

/

返回文章
返回