BEPCⅡ电子环寄生模损失测量

Parasitic mode loss measurement in BEPCⅡ e- ring

  • 摘要: BEPCII在设计阶段从束流不稳定性和寄生模损失角度对阻抗提出了限制,但在BEPCII运行中寄生模损失是影响高流强稳定运行的因素之一。针对BEPCII电子环的寄生模损失进行了测量,主要是基于同步相移随流强的微小变化、束流功率测量和高阶模吸收器的功率。测量结果表明:两种方法对比测量全环寄生模损失,结果重复可信,且全环寄生模损失是超导腔寄生模损失的4~5倍。

     

    Abstract: In the design phase of BEPCII, the impedance is limited in terms of beam instabilities and parasitic mode loss. However, the parasitic mode loss has been one of the unfavorable factors affecting high beam current operation of BEPCII. This paper describes a measurement of the parasitic mode loss in BEPCII e- ring, which is based on a small change of synchronous phase shift with beam current, the beam power measurement and the power of higher order mode absorber. The measurement results with two different methods of the total parasitic mode loss are repetitive and reliable. Moreover, the total parasitic mode loss of e- ring is 4-5 times as large as the parasitic mode loss of the superconducting cavity.

     

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