Abstract: The simulated results have shown that the direction of Cherenkov Radiation (CR) light in very thin layer can be used to measure electron beam divergence and its distribution directly. The measurement results are reliable if the parameters of devices used in the system are suited for the electron beam. This method is easy in data processing because it has no need to assume electron beam phasic space, beam divergence distribution, charge density distribution model and so on. The electron beam divergence distribution measurement system can be established by way of taking a thin enough quartz slice as the convertor and letting the electron beam incidence enter the convertor with Cherenkov radiation angle. Focus plane imaging method is required to obtain the divergence image of space distribution of electron at the same time. The beam divergence measurement technology and equipment development achieved on high current pulsed linear induction accelerator have proved that the system has the characteristics of simple structure, low difficulty and fast speed of data processing.