Abstract: With the increasing demand for diagnostics of high-energy-density (HED) materials, X-ray interferometric imaging technology has gained significant attention and application in this field. This paper primarily reviews the latest domestic and international advancements in X-ray interferometric imaging techniques and systems, focusing on the principles and capabilities of X-ray grating imaging based on Talbot and Talbot-Lau interferometry. Talbot and Talbot-Lau interferometry utilize gratings with periodic structures to perform high-precision measurements of X-ray phase, absorption, and scattering properties, enabling non-destructive inspection and imaging of internal structures of samples. This work summarizes the application of these techniques in diagnostic experiments for HED materials, introduces the Talbot Interferometric Analysis (TIA) code, and demonstrates an initial simulation by integrating the TIA program with the Flash hydrodynamics code. The simulation successfully retrieved three types of information: absorption, phase, and dark-field from the Flash model. Finally, the paper concludes with a summary and outlook on the application of X-ray Talbot-Lau interferometric diagnostic technology in HED plasma experiments.