基于深度学习的小样本光学元件表面瑕疵识别

Few-shot defect recognition in optical components with deep learning

  • 摘要: 针对小样本高功率固体激光装置中光学元件表面疵病的精准检测需求,基于ICFNet提出了一种融合数据增强与深度残差网络的检测方法ICFNetV2。首先采用残差连接机制与通道解耦卷积操作的协同设计,搭建了包含34个层级联模块的深度网络架构,成功抑制了深层网络训练中的梯度衰减现象,并显著提升了特征跨层传递效率。网络中嵌入了空间Dropout层,同时在数据预处理阶段采用随机旋转、镜像翻转和高斯噪声注入等数据增强策略,将训练样本量扩展至原始数据集的9倍,提升了模型的泛化能力。消融实验进一步证实网络中模块的有效性。实验结果表明,改进后的ICFNetV2在麻点、划痕和灰尘三类疵病分类任务中达到97.4%的准确率,相较ICFNet模型提升0.7%。

     

    Abstract:
    Background
    Surface defects on optical components in high-power solid-state laser systems seriously impair the system’s operational stability and laser output performance. However, precise detection of such defects under few-shot conditions remains a critical challenge, as limited training data often restricts the generalization ability of detection models and creates an urgent need for high-performance defect detection methods adapted to this scenario.
    Purpose
    To address this issue, this study aims to design and propose an enhanced detection method dubbed ICFNetV2, which is developed based on the existing ICFNet. Its core goal is to improve the accuracy and generalization of optical component surface defect detection under few-shot scenarios.
    Methods
    ICFNetV2 integrates data augmentation techniques with deep residual networks: Its framework adopts a synergistic design of residual connection mechanisms and decoupled channel convolution operations to construct a 34-layer cascaded network—this structure mitigates gradient decay during deep network training and enhances cross-layer feature transmission efficiency. The network also incorporates spatial dropout layers and implements a data preprocessing pipeline encompassing random rotation, mirror flipping, and Gaussian noise injection, which expands the training dataset to 9 times its original size. Additionally, ablation studies were conducted to verify the efficacy of each individual network module.
    Results
    Experimental results demonstrate that the optimized ICFNetV2 achieves a classification accuracy of 97.4% for three typical defect types, representing a 0.7% improvement over the baseline ICFNet model.
    Conclusions
    In conclusion, ICFNetV2 effectively enhances defect detection performance under few-shot conditions through architectural optimization and data augmentation. The validation from ablation studies and the observed accuracy gains confirm the effectiveness of its key modules, providing a reliable solution for surface defect detection of optical components in high-power solid-state laser systems and offering reference value for similar few-shot detection tasks.

     

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