微秒脉冲下云母电容的寿命特性

Lifetime characteristics of mica capacitor under microsecond pulse

  • 摘要: 近年来,快速发展的卷绕式云母纸电容器较大地提升了其工作电压,有希望用于提升PFN-Marx(pulse forming line - Marx)发生器的整体储能密度水平。电容器寿命是确保装置可靠性的重要因素,而该电容器的寿命特性尚未清楚,其最优工作条件和装置的预期工作寿命未能明确。基于此,开展了微秒脉冲下云母电容寿命特性的预测模型和实验研究。首先,分析了云母电容的内部结构,建立仿真模型并进行了电场、热场模拟分析。其次,搭建了一个能够稳定长时间工作的寿命测试平台,通过该平台获取并分析了云母电容的退化参数、寿命数据和失效机理。根据寿命数据结果,修正了在给定运行因素下的云母电容寿命预测模型。结果表明,寿命预测模型与寿命测试结果基本匹配。研究工作将有助于发展云母电容的寿命预测,并为在微秒脉冲下使用云母电容的系统装置设计提供参考。

     

    Abstract:
    Background
    In recent years, the development of wound-type mica paper capacitors has significantly enhanced their operating voltage and energy density, and they remain highly reliable, showing potential for improving the overall energy storage density of PFN (pulse forming line)-Marx generators.
    Purpose
    The lifetime of the capacitor is a crucial factor in ensuring system reliability. The lifetime of the mica paper capacitor reaches up to 100,000 times, meeting the requirements of highly compact pulse power drivers. However, the lifetime characteristics of this capacitor remain unclear, and its optimal operating conditions have not been well-defined.
    Methods
    In this paper, an investigation into the lifetime characteristics of mica paper capacitors under microsecond pulses is presented. First, the structure of the capacitor is analyzed in detail. Subsequently, numerical simulations of the electrical and thermal fields are carried out to further study its characteristics. To accurately test the mica paper capacitors, a lifetime test platform that can operate stably over an extended period was constructed.
    Results
    Through the utilization of this platform, the electrical degradation parameters and the failure mechanisms of the mica paper capacitors are obtained and analyzed. Based on the test data, the lifetime empirical model of mica capacitors under given operating conditions is modified.
    Conclusions
    The results of the experiments and calculations of the lifetime empirical model indicate that the model aligns well with the experimental results. This work contributes to the lifetime prediction of mica capacitors and provides the design reference for system devices using mica capacitor under microsecond pulses.

     

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