质子辐射探测技术研究进展

Research progress in proton radiation detection technology

  • 摘要: 空间和核领域的电子器件及系统受质子辐射效应的严重威胁,对辐射环境参数的精准探测是辐射效应研究、损伤评估和加固的前提。为实现质子辐射高效精准的探测,本研究报道了国内外质子辐射探测的主要技术及其研究进展,对气体探测器、闪烁体探测器和半导体探测器的探测原理及技术特点进行了充分调研和总结。采用10 MeV质子束对一款CMOS图像传感器开展辐照实验,获得了不同质子辐照注量下CMOS图像传感器敏感参数的退化情况。研究发现,CMOS图像传感器对质子辐射非常敏感,暗信号对质子注量的响应线性度最佳,在注量0~2×1011 p/cm2范围内线性误差低于8%,在质子辐射探测领域具有良好的应用前景。

     

    Abstract:
    Background Electronic devices and systems applied in space and nuclear fields are facing severe threats from proton radiation effects. Accurate detection of radiation environment parameters is an essential prerequisite for conducting research on radiation effects, assessing device damage, and implementing radiation hardening technologies.
    Purpose This study is intended to summarize the main technologies and research progress of proton radiation detection at home and abroad, explore the application potential of CMOS image sensors in this field, and provide a reference for the development of efficient and accurate proton radiation detection technologies.
    Methods First, the detection principles and technical characteristics of three main types of proton radiation detectors (gas detectors, scintillation detectors, and semiconductor detectors) were comprehensively investigated and summarized. Then, an irradiation experiment was carried out on a CMOS image sensor using 10 MeV protons, and the variation of its sensitive parameters under different proton irradiation fluences was tested and analyzed.
    Results The experimental results show that CMOS image sensors are highly sensitive to proton radiation. Among all sensitive parameters, the dark signal exhibits the best linear response to proton fluence, with a linear error of less than 8% in the range of 0~2×1011 p/cm2.
    Conclusions CMOS image sensors have good application prospects in the field of proton radiation detection due to their high sensitivity to proton radiation and the excellent linear response of dark signal to proton fluence.

     

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