325 MHz连续波2500 W GaN HEMT功率放大器

325 MHz continuous wave 2500 W GaN HEMT power amplifier

  • 摘要: 本文基于GaN HEMT器件,设计和制作UHF频段的超大功率、高效率的固态射频微波放大器,以满足科学、医疗和工业应用。采用0.8 μm GaN HEMT工艺,借助微波软件进行电、磁和热等设计和仿真等,首先在器件层面上优化器件的源漏间距、场板结构和衬底减薄等尺寸,器件击穿电压提升400 V;其次在装配工艺层面优化AuSb焊料烧结工艺,提升大功率管芯烧结于金刚石铜管壳成品率,空洞率小于5%,有效降低热阻;最后在电路制作层面选用高低不同的介电常数PCB和采用谐波调谐技术,实现准方波电压和半正弦电流波形,降低器件功耗,提升漏极效率。调测结果如下:在工作电压50 V、栅极电压−3 V、频率325 MHz、连续波工作状态下实现了饱和输出功率大于2 500 W,功率附加效率大于85%,功率增益大于19 dB,热阻降低至0.20 ℃/W,效率指标比同类LDMOS高10%以上。成功实现了GaN HEMT放大器向低频领域的扩展,可广泛应用于工艺加热、医疗和大科学装置等领域。

     

    Abstract:
    Background The escalating demand for ultra-high-power radio frequency(RF) sources in scientific research (e.g., particle accelerators), industrial heating, and advanced medical equipment necessitates breakthroughs in solid-state microwave amplifier technology. While GaN HEMT devices offer superior power density, extending their operation to lower UHF bands while maintaining extreme efficiency remains a critical challenge due to thermal management limitations and waveform engineering complexities.
    Purpose This study aims to design and fabricate an ultra-high-power, high-efficiency solid-state microwave amplifier operating in the UHF band based on GaN HEMT technology, specifically targeting continuous-wave(CW) output exceeding 2500W with a drain efficiency greater than 85%.
    Methods Utilizing a 0.8 μm GaN HEMT process, comprehensive electro-thermal co-design and simulation were conducted. At the device level, source-drain spacing, field plate structures, and substrate thinning were optimized to enhance breakdown voltage. At the assembly level, AuSb solder sintering processes were refined to improve die-attach yield on Cu-diamond heat sinks, minimizing voids. At the circuit level, a hybrid PCB stack-up with varying dielectric constants and harmonic tuning networks were implemented to shape quasi-square voltage and half-sinusoidal current waveforms, thereby reducing power dissipation.
    Results Under a CW operating condition of 325 MHz with a drain voltage of 50V and gate voltage of -3V, the fabricated amplifier achieved a saturated output power of >2500 W, a power-added efficiency (PAE) of >85%, and a power gain of >19 dB. The thermal resistance was successfully reduced to 0.20 ℃/W, and the efficiency outperformed comparable LDMOS-based technologies by over 10%.
    Conclusions The successful demonstration of this GaN HEMT amplifier not only validates the feasibility of extending high-performance GaN devices into the low-frequency UHF regime but also provides a robust technological solution for applications requiring multi-kilowatt RF power, such as industrial heating, medical systems, and large-scale scientific facilities.

     

/

返回文章
返回