遥控模拟装置在NB-HPM辐照下的毁伤实验研究

Experimental study on damage of remote controlled simulation device under NB-HPM irradiation

  • 摘要: 窄带高功率微波(NB-HPM)是安全处置电子简易爆炸装置的一种有效手段,为探究电子简易爆炸装置被NB-HPM作用后的损伤阈值和损坏机理,开展了L~X波段NB-HPM对遥控模拟装置的辐照试验。试验结果表明HPM频率是影响遥控模拟装置毁伤效果的关键因素之一,L~X波段中L波段对遥控模拟装置的毁伤效果最好、损伤阈值最低。模拟装置损坏是由于其内部8D423TS芯片整体报废,其中芯片内部电源网络和功率管理电路为核心重损区,内部隔离层和电机驱动输出级功能失效,射频前端受其他模块影响无法正常工作。为进一步研究NB-HPM进入遥控模拟装置的耦合路径,搭建了遥控模拟装置的场仿真模型和路仿真模型,并通过场路协同仿真模拟了窄带高功率微波在遥控模拟装置中的耦合过程。仿真结果表明,线缆是能量耦合的重要途径,当HPM频率较低时,其耦合路径相对单一,遵循更容易耦合进长度接近HPM半波长奇数倍的线缆的效应规律;当HPM频率较高时,其耦合路径相对复杂,HPM的耦合信号强弱逐渐与线缆长度解耦。研究结果可以为窄带高功率微波处置遥控简易爆炸装置提供数据支撑和参考依据。

     

    Abstract:
    Background In recent years, the widespread deployment of electronic improvised explosive devices (E-IEDs) has posed severe threats to the public and governments worldwide. Safe and effective neutralization of E-IEDs constitutes a practical challenge confronted by nations in both military operations and non-military missions such as counter-terrorism and emergency response. High power microwave (HPM) features prominent advantages including long effective range, high neutralization efficiency and low operational cost, rendering it an effective approach for safe disposal of E-IEDs. Therefore, investigating the actual effects of HPM on E-IEDs is of great significance.
    Purpose This paper investigates the damage effects of narrow band high power microwave (NB-HPM) of different frequency bands on remote controlled simulation devices by combining irradiation experiments and electromagnetic simulation.
    Methods Irradiation experiments with NB-HPM covering the L- to X- band were carried out on the remote controlled simulation device. The damage performance and damage thresholds under different NB-HPM bands were explored, and specific failure modes of the device were analyzed. Field-circuit co-simulation was adopted to model the NB-HPM coupling process within the remote controlled simulation device, and internal HPM coupling paths were analyzed.
    Results Experimental results demonstrate that HPM frequency is one of the critical factors governing damage performance of the remote controlled simulation device. Among the L-X bands, the L-band delivers the optimal damage effect with the lowest damage threshold. Device failure originates from complete burnout of the internal 8D423TS chip. The internal power network and power management circuit serve as the core heavily-damaged regions; the internal isolation layer and motor drive output stage lose their functions, and the radio-frequency (RF) front-end fails to operate properly due to interference from other modules. Simulation results indicate that cables act as a major energy-coupling pathway. At low HPM frequencies, coupling paths are relatively simple, following the rule that cables with lengths close to odd multiples of half the HPM wavelength tend to receive stronger coupled energy. At high HPM frequencies, coupling paths become complex, and the magnitude of coupled HPM signals gradually decouples from cable length.
    Conclusions This paper presents an in-depth study on the damage effects of NB-HPM on the remote controlled simulation device based on irradiation experiments and field-circuit co-simulation. The obtained results can provide data support and technical references for HPM-based neutralization of remote controlled improvised explosive devices.

     

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