KDP/DKDP晶体定向生长中籽晶取向对微观缺陷与光学均匀性的影响机制

Experimental study on seed orientation control for improving optical quality of directionally grown KDP/DKDP crystals

  • 摘要: 籽晶取向是晶体定向生长的关键参数,但其对但其对微观缺陷形成及光学性能的影响机制尚不明确。本文采用传统降温法,系统研究了籽晶与Z面夹角分别为0°、30°、45°和60°时KDP/DKDP晶体的形态演化、光学性能及微观缺陷特征。通过正电子湮没寿命谱(PALS)揭示了取向依赖的缺陷形成机制:30°取向因恢复区(籽晶表面至晶体恢复理想晶习形态前的生长区域)中101锥面发育高度不对称,锥面生长速率差异导致不同锥面的缺陷出现差异,空位型缺陷浓度最高(κd=3.68),整体透过率低于其他样品;0°取向的恢复区对称性最高,应力场最均匀,缺陷捕获率最低(κd=2.93),折射率均匀性最优(ΔnRMS=1.43×106)。缺陷捕获率κd与355 nm透过率呈负相关(R2=0.87)。形态演化研究表明,籽晶取向通过改变恢复区中101锥面的暴露面积分布及其对称性,系统性调控恢复区的几何形态,可在减小晶体恢复区,保持较高的光学质量。

     

    Abstract:
    Background Seed orientation is a key parameter for oriented crystal growth, yet its systematic influence on growth kinetics, micro-defect formation, and macroscopic properties remains unclear. Although oriented growth has been explored as a potential method to improve crystal utilization efficiency, the fundamental mechanisms linking seed orientation to defect formation, optical quality, and morphological evolution have not been systematically established.
    Purpose This study aims to systematically investigate how seed orientation modulates the morphological evolution, optical properties, and micro-defect characteristics of KDP/DKDP crystals, and to establish quantitative correlations between orientation-dependent defect formation mechanisms and macroscopic crystal performance.
    Methods The traditional temperature reduction method was employed to grow KDP/DKDP crystals with seed orientations at angles of 0°, 30°, 45°, and 60° relative to the Z-plane. Positron Annihilation Lifetime Spectroscopy (PALS) was used to characterize vacancy-type defects and calculate defect trapping rates (κd). UV transmittance measurements at 355 nm and refractive index uniformity assessments (ΔnRMS) were performed to evaluate optical quality. Three-dimensional morphological reconstruction was conducted to quantify recovery region geometry, including volume calculations and symmetry analysis of 101 pyramidal faces.
    Results PALS analysis reveals distinct orientation-dependent defect formation mechanisms: the 30°-cut exhibits the highest defect trapping rate (κd=3.68) and lowest UV transmittance (~89%) due to highly asymmetric development of 101 pyramidal faces and large stress field gradients in the recovery region; the 0°-cut demonstrates the lowest defect trapping rate (κd = 2.93) and optimal refractive index uniformity (ΔnRMS = 1.43×106) owing to the highest recovery region symmetry and most uniform stress field; the 45°-cut produces the smallest recovery region volume (0.02×103 cm3), while the 60°-cut yields the largest (11.49×103 cm3) with complicated recovery paths involving passive exposure of 100 faces. A significant negative correlation between defect trapping rate κd and transmittance at 355 nm was established (R2=0.87), demonstrating the direct impact of orientation-induced defects on optical performance.
    Conclusions Seed orientation systematically modulates crystal quality by altering the geometry, symmetry, and stress distribution of the recovery region through control of 101 pyramidal face exposure and growth kinetics. While oriented grown crystals cannot perfectly replace conventional Z-cut seeds, strategic selection of seed orientation (particularly 0° and 45°-cuts) can reduce recovery region volume, improve crystal utilization efficiency, and maintain high optical quality for large-aperture KDP/DKDP crystal applications in high-power laser systems.

     

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