用于高重频电子束逐束团发射度表征的偏转腔设计

Design of deflecting cavity for bunch-by-bunch emittance characterization of high repetition-rate electron beams

  • 摘要: 超高重频硬XFEL是解决国防、能源、航空航天等领域研究中,动态诊断能力不足的基础设施。为了实现数十keV的高光子能量,需要进一步减小电子束的切片发射度,在百MHz级重频下,实现逐束团、高精度表征成为关键技术难题。面向这一需求,本文提出了非整数倍频横模偏转腔的解决方案,通过分析制约条件确定偏转腔的工作频率,使用仿真完成了腔体的物理设计,自编程序检验了束团分离与调制效果,最后基于该偏转腔构建了一套表征系统,在典型参数设置下,时间分辨率可达2 ps以下,能够实现有效的切片发射度测量。本文所设计的非整数倍频偏转腔表征系统,为百MHz级超高重频下, 逐束团切片发射度的高精度表征,提供了一种可行的诊断工具,为支撑束流物理精密研究奠定了基础。有望为我国百MHz级重频、低发射度光阴极注入器研究平台提供核心表征能力。

     

    Abstract:
    Background The high-repetition-rate hard X-ray free electron laser (HXFEL) facility offers a dynamic diagnostic capability that is crucial for research fields such as national defense, energy industry, aerospace science, and beyond. To achieve the desired output photon energies of up to tens of keV, further reduction of the beam slice emittance is needed. At repetition rates on the order of hundreds of MHz, bunch-by-bunch high-precision measurement of beam emittance poses a key challenge.
    Purpose To address this challenge, this paper proposes a non-integer-harmonic transverse deflecting cavity (TDC) as a solution. It can impart different deflection angles to individual bunches based on automatic phase slip, realizing bunch-by-bunch slice emittance measurement.
    Methods The operating frequency of TDC are determined through constraint analysis and comparison of various frequency selecting method. A physical design of the deflecting cavity is obtained through CST simulation. Using the simulated electromagnetic field distribution, a self-developed program is developed to verify the bunch separation and modulation effects. Then a typical beamline is constructed to study the feasibility of slice emittance measurement using the non-integer-harmonic TDC.
    Results Simulations revealed that the most balanced separation effect is achieved under operating frequency of 210 MHz. A typical resolution of better than 2 ps is achieved using the beam transport settings, enabling effective measurement of beam slice emittance.
    Conclusions The non-integer-harmonic deflecting cavity system presented in this paper provides a feasible diagnostic tool for high-precision bunch-by-bunch slice emittance measurement at hundred-MHz-level repetition rates. It is expected to support China's research platforms for high-repetition-rate low-emittance photocathode injectors.

     

/

返回文章
返回