激光等离子体谱线线型研究与谱线强度测量
RESEARCH OF SPECTRUM LINESHAPE AND PRECISE MEASUREMENTS OF LINE INTENSITY IN LASER PLASMAS
-
摘要: 在对激光等离子体中不同区域发射的X光光谱谱线的加宽机制(如Doppler展宽、Stark展宽等)及谱线线型研究的基础上,构造了不同的线型拟合函数。通过和实验谱线的数据拟合,可以精确测量等离子体发射的X射线光谱强度。和截断法相比,该方法的优点是可以方便地根据谱线的不同展宽机制将相应的线谱和背景连续谱以及邻近的线谱分开,从而达到精确测量线光谱强度的目的。该方法不但能够应用于激光等离子体发射的光谱,也可用于其它波段的线谱强度的精确测量。Abstract: X-ray spectrum emissions from different regions in laser plasma have different lineshape due to Doppler or Stark broadening effects. These effects were analyzed in our experiment and corresponding fitting functions are structured. Through the fitting to the experimental spectrum data,the ture lineshape can be obtained, so the line intensity can be precise measured. This method can not only be applied to spectra radiated by laser plasmas,but also spectra in other wavelength.
下载: