狭缝法测量X射线斑点大小

Slit X-ray spot size measurement technique

  • 摘要: 应用狭缝光阑成像法测量X射线斑点大小,通过狭缝成像获得光源的线扩展函数和调制传递函数MTF,而后从MTF为0.5所对应的空间频率之值确定出光源的光斑大小。应用该方法测量得到12 MeV 直线感应加速器(LIA)X射线斑点大小为3.2 mm,及磁透镜在不同焦距下的X射线斑点大小。该项测量为12 MeV LIA电子束聚焦调试实验提供有效判据。

     

    Abstract: The high intense electron beam interacts with a high Z target, producing the X-rays for flash radiography. The focal spot size of the X-ray source is a critical parameter which degrades resolution in the flash radiography. This paper describes a slit which is used to measure the focal spot size. The X-ray spot image is obtained through the slit. The line spread function(LSF) and modulation transfer function(MTF) of X-ray spot are obtained from the slit image data, and the X-ray spot size is determined by the MTF. The measured X-ray spot size of the 12 MeV linear induction accelerator(LIA) is 3.2 mm. Different focal lengths are used, and the relevant X-ray spots size is measured for tuning the accelerator.

     

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