GeⅩⅩ~GeⅩⅩⅥ谱线的测量和辨认
THE XUV SPECTRA IN LASER-PRODUCED Ge PLASMAS
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摘要: 测量了线聚焦激光加热锗等离子体发射的XUV光谱,对GeXX~GeXXⅥ谱线进行了辨认和分类。给出了谱线波长和相对强度;计算了辐射跃迁几率和吸收振子强度;并与其它实验室有关结果进行了比较。Abstract: The XUV spectra emitted from line focused-laser-produced Ge plasmas were observed.A 1-m grazing-incidence spectrograph viewed the plasma in the axial direction. The spectra due to transitions in GeXX~GeXXⅥ were identified.The wavelengtha and intensities of the spectral lines were given. Calculations on spontaneous decay rates and absorption oscillator strengths of the spectra are performed.
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