X光底片在位相对标定

AN IN-SITU RELATIVE CALIBRATION FOR X-RAY FILM

  • 摘要: 本文描述了X光底片在位相对标定技术。其原理是使X射线谱经阶梯形吸收滤片透射后,对X光底片曝光,测量底片的曝光量。文中给出了标定方法和数据处理方法,而且也给出了在X光激光实验中得到的Kodak AA5底片的特性曲线。

     

    Abstract: An in-situ relative calibration technique for X-ray film is described in this paper. The technique is based on film exposure measurements which is irradiated by x-rays transmitted through a stepwedge absorption filter. The calibration method and the treatment method of data are given. Also, we present a characteristic curve for Kodak AA5 film obtained in an X-ray laser experiment.

     

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