高能量密度物质的X射线Talbot-Lau干涉诊断技术综述

陈泽畑; 仵武汉; 李昆

doi:10.11884/HPLPB202537.240312

高能量密度物质的X射线Talbot-Lau干涉诊断技术综述

doi: 10.11884/HPLPB202537.240312

汕头大学物理系，广东汕头 515063

基金项目: 国家自然科学基金项目(U2330123);

详细信息

作者简介:
陈泽畑，22ztchen@stu.edu.cn

通讯作者:
李　昆，kunli@stu.edu.cn。

中图分类号: TN124
计量
- 文章访问数: 78
- HTML全文浏览量: 50
- PDF下载量: 10
- 被引次数: 0
出版历程
- 收稿日期: 2024-07-27
- 修回日期: 2024-10-20
- 录用日期: 2024-12-03
- 网络出版日期: 2025-01-17

Review of x-ray Talbot-Lau interferometric diagnostics for high energy density matter

Shantou University, Department of Physics, Shantou, Guangdong 515063, China

摘要

摘要: 随着高能量密度（HED）物质诊断需求的日益增长，X射线干涉成像技术在该领域得到了广泛关注和应用。主要综述了X射线干涉成像技术与系统的国内外最新进展，介绍了基于Talbot和Talbot-Lau干涉的X射线光栅成像原理和能力，Talbot干涉和Talbot-Lau干涉是通过利用具有周期性结构的光栅，对X射线的相位、吸收和散射特性进行高精度测量，从而实现对样品内部结构的无损检测与成像。总结了该技术在高能量密度物质诊断实验中的应用，介绍了Talbot干涉分析（TIA）代码，并依靠了TIA程序与Flash流体力学代码结合进行了初步模拟，成功获取了Flash模型中的吸收、相位和暗场三种信息，最后总结和展望了X射线Talbot-Lau干涉诊断技术在高能量密度等离子体实验中的应用。
- Talbot-Lau /
- 高能量密度 /
- 等离子体 /
- X射线成像 /
- 干涉
Abstract: With the increasing demand for diagnostics of high-energy-density (HED) materials, X-ray interferometric imaging technology has gained significant attention and application in this field. This paper primarily reviews the latest domestic and international advancements in X-ray interferometric imaging techniques and systems, focusing on the principles and capabilities of X-ray grating imaging based on Talbot and Talbot-Lau interferometry. Talbot and Talbot-Lau interferometry utilize gratings with periodic structures to perform high-precision measurements of X-ray phase, absorption, and scattering properties, enabling non-destructive inspection and imaging of internal structures of samples. This work summarizes the application of these techniques in diagnostic experiments for HED materials, introduces the Talbot Interferometric Analysis (TIA) code, and demonstrates an initial simulation by integrating the TIA program with the Flash hydrodynamics code. The simulation successfully retrieved three types of information: absorption, phase, and dark-field from the Flash model. Finally, the paper concludes with a summary and outlook on the application of X-ray Talbot-Lau interferometric diagnostic technology in high-energy-density plasma experiments.
- Talbot-Lau /
- High-Energy Density /
- Plasma /
- X-ray Imaging /
- Interferometry

HTML全文

图 1 在入射平面相干光照明下，周期为p的不同类型分束光栅G1后的强度分布图(黑白虚线表示最大对比度的点^[19])

Figure 1. Shows the intensity distribution after different types of gratings G1 under coherent light illumination in the incident plane, with a period (black and white dashed lines represent points of maximum contrast.^[19])

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图 2 基于光栅的硬X射线干涉仪^[9]

Figure 2. Grating-based hard X-ray interferometer^[9]

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图 3 使用点光源X射线的Talbot-Lau干涉仪示意图^[31]

Figure 3. Schematic diagram of a Talbot-Lau interferometer using a point source X-ray^[31]

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图 4 Talbot-Lau干涉仪的差分相位对比成像装置示意图^[15]

Figure 4. Layout of differential phase contrast imaging setup with Talbot-Lau interferometer^[15]

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图 5 能量低于10 keV的X射线，通过Talbot-Lau干涉技术对直径1.5 mm的PMMA球进行成像的结果^[33]

Figure 5. Imaging results of a 1.5 mm diameter PMMA sphere using Talbot-Lau interferometry with X-rays of energy below 10 keV^[33]

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图 6 Talbot-Lau X射线偏转仪在MTW目标室内的物理布局^[35]

Figure 6. The physical layout of the Talbot-Lau X-ray deflectometer in the MTW target chamber^[35]

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图 7 超短脉冲时间分辨 X 射线 Talbot-Lau 干涉实验前端光路示意图^[38]。

Figure 7. Schematic diagram of the optical path at the front end of the ultrashort pulse time-resolved X-ray Talbot-Lau interferometry experiment^[38]

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图 8 Talbot-Lau X射线干涉法诊断平台，用于OMEGA EP激光设施^[38]

Figure 8. The Talbot-Lau X-ray interferometry diagnostic platform is designed for the OMEGA EP laser facility^[38]

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图 9 首次在OMEGA EP激光器上使用Talbot-Lau X射线干涉技术获得的实验结果^[39]。

Figure 9. Experimental results obtained using Talbot-Lau X-ray interferometry on the OMEGA EP laser for the first time^[39]

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图 10 高重复率激光设施中进行Talbot-Lau X射线干涉成像的实验装置示意图^[40]

Figure 10. Schematic diagram of the experimental setup for Talbot-Lau X-ray interferometry in a high-repetition-rate laser facility^[40]

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图 11 等离子体靶结构设计及密度演化^[16]

Figure 11. Plasma target structure design and its density evolution^[16]

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图 12 经过分析工具TIA生成的干涉图和参考图^[16]

Figure 12. Interferogram and reference image generated by the post-processing tool TIA in an example case. ^[16]

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图 13 使用TIA处理后得到的结果^[16]

Figure 13. Results obtained after processing with TIA^[16]

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图 14 使用TIA工具对Flash模型进行成像分析

Figure 14. Perform imaging analysis on the Flash model using the TIA tool

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