Research on the equivalence of honeycomb structures based on the improved S-parameter inversion method
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摘要: 本文基于改进的S参数反演法，对具有色散特性和各向异性的蜂窝结构复合材料进行了等效化研究。利用三维电磁仿真软件CST与自由空间测试系统，完成对蜂窝结构及其等效平板的建模、仿真和实物测试。通过改变平面波的入射角度，分别获取垂直入射和斜入射条件下的蜂窝模型散射参数。利用反演程序依次推导出各入射条件对应的等效电磁参数，并将其应用于等效的匀质平板中，从而实现对蜂窝结构的等效化处理。通过对比蜂窝结构等效前后散射参数的仿真和实测结果，验证了该方法的准确性和可行性。Abstract: This paper conducts an equivalence study on honeycomb structures with dispersion characteristics and anisotropy based on an improved S-parameter inversion method. Using three-dimensional electromagnetic simulation software CST and a free-space measurement system, the modeling, simulation, and practical testing of the honeycomb structure and its equivalent flat plate were successfully accomplished. By varying the incident angle of the plane wave, the scattering parameters of the honeycomb model were obtained under both normal and oblique incidence conditions. Through an inversion procedure, the equivalent electromagnetic parameters corresponding to each incident condition were sequentially derived and subsequently applied to the equivalent homogeneous flat plate, thereby achieving the equivalency treatment of the honeycomb structure. The accuracy and feasibility of this method are verified by comparing the simulation and measurement results of scattering parameters before and after the equivalence of the honeycomb structure.
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图 1 平面波斜入射介质平板的示意图
Figure 1. Diagram of a plane wave oblique incident on a dielectric slab
图 4 不同入射角下等效电磁参数反演结果
Figure 4. Inversion results of equivalent electromagnetic parameters at different incidence angles
图 5 0°入射时等效前后模型的S参数对比图
Figure 5. Comparison of S-parameters of the model before and after the equivalent model at 0°incident
图 6 30°入射时等效前后模型的S参数对比图
Figure 6. Comparison of S-parameters of the model before and after the equivalent model at 30°incident
图 7 60°入射时等效前后模型的S参数对比图
Figure 7. Comparison of S-parameters of the model before and after the equivalent model at 60°incident
图 9 垂直入射条件下蜂窝等效前后散射参数对比
Figure 9. Comparison of honeycomb equivalent back-and-forth scattering parameters under vertical incidence conditions
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