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基于InP折射率变化的辐射图像探测技术原理验证

涂艳云 马继明 宋岩 张健 徐青 孙铁平 彭博栋 韩长材 李阳 郭泉 张骞 高可庆 李郎郎 刘振

涂艳云, 马继明, 宋岩, 等. 基于InP折射率变化的辐射图像探测技术原理验证[J]. 强激光与粒子束, 2025, 37: 106007. doi: 10.11884/HPLPB202537.250230
引用本文: 涂艳云, 马继明, 宋岩, 等. 基于InP折射率变化的辐射图像探测技术原理验证[J]. 强激光与粒子束, 2025, 37: 106007. doi: 10.11884/HPLPB202537.250230
Tu Yanyun, Ma Jiming, Song Yan, et al. Proof-of-principle of radiation detecting technology based on InP refractive index changes[J]. High Power Laser and Particle Beams, 2025, 37: 106007. doi: 10.11884/HPLPB202537.250230
Citation: Tu Yanyun, Ma Jiming, Song Yan, et al. Proof-of-principle of radiation detecting technology based on InP refractive index changes[J]. High Power Laser and Particle Beams, 2025, 37: 106007. doi: 10.11884/HPLPB202537.250230

基于InP折射率变化的辐射图像探测技术原理验证

doi: 10.11884/HPLPB202537.250230
基金项目: 国防科技卓越青年科学基金项目(JQZQ021902)
详细信息
    作者简介:

    涂艳云,tuyanyun@nint.ac.cn

    通讯作者:

    马继明,majiming@nint.ac.cn

  • 中图分类号: TL81

Proof-of-principle of radiation detecting technology based on InP refractive index changes

  • 摘要: 为了验证基于磷化铟(InP)晶体折射率变化的辐射图像探测技术对脉冲射线探测的有效性,开展了原理验证实验。搭建了基于迈克尔逊干涉仪的辐射图像探测系统,采用350 μm厚的掺铁InP晶体作为辐射转换晶体。利用该系统成功获取了该晶体在532 nm激光脉冲激发下的干涉条纹变化图像。基于泵浦-探测技术测得掺铁InP晶体在532 nm泵浦激光下的时间响应为1.5 ns。通过在泵浦激光光路中放置分辨率板测量空间分辨率,重构结果表明,系统的空间分辨率可达1 lp/mm。实验结果表明,基于InP折射率变化的超快图像探测技术初步验证可行,该系统有望用于发展具有高时间与高空间分辨能力的脉冲射线探测技术。
  • 图  1  激光脉冲波形和实验系统示意图

    Figure  1.  Waveform of laser pulse and schematic of the experimental system

    图  2  无泵浦激光激发和有泵浦激光激发的干涉条纹图

    Figure  2.  Comparison of interferograms without and with pump laser excitation

    图  3  无泵浦激发和有泵浦激发下的干涉条纹图、分辨率卡和重建图

    Figure  3.  Comparison of interferograms without and with pump excitation, resolution target, and reconstructed image

    图  4  不同泵浦探测延时时间下的干涉条纹图

    Figure  4.  Interferograms at different pump-probe delay times

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出版历程
  • 收稿日期:  2025-07-20
  • 修回日期:  2025-09-21
  • 录用日期:  2025-09-21
  • 网络出版日期:  2025-09-25
  • 刊出日期:  2025-10-15

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