Abstract:
Background X/γ-ray irradiation of an electronic system shielding box will penetrate the box body, generate photoelectrons or Compton electrons on the surface layers or inside the system, and excite electromagnetic pulses. These particles or electromagnetic fields will interfere with or even damage the sensitive electronic components of the electronic system inside the box, affecting the regular operation of the electronic system.
Purpose To rapidly assess the particle and electromagnetic environment inside electronic systems under radiation exposure and enable timely protective measures that mitigate radiation-induced damage and ensure reliable operation.
Methods We present a theoretical analysis of irradiation responses arising from two coupling mechanisms: electromagnetic pulses excited by primary particles within the cavity of a shielded enclosure and their field-to-circuit coupling to a printed circuit board (PCB), and direct multi-layer penetration coupling of ionizing radiation. Equivalent-circuit models were constructed to represent these coupling paths, and transient current responses were calculated analytically.
Results The transient current responses of the shielded enclosure under high-energy radiation, computed using the equivalent-circuit approach, reproduce the trends observed in published experimental measurements and exhibit approximate numerical agreement.
Conclusions The results validate the proposed theoretical modeling approach, showing that analytical equivalent-circuit analysis can provide rapid, simulation-free estimates of radiation effects on electronic systems. The method can be extended to scenarios that more closely match practical applications.
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